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Dynamic Modeling for Nanomanipulation of Polystyrene Nonorod by AFM
M. Moradi (MSc.)
Abdoulhosein Fereidoon [PhD.]
Sadegh Sadeghzadeh [MSc.]
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Nanomanipulation using Atomic Force Microscope (AFM) is one of the new emerging approaches to manufacturing in nano scale. Wide spread applications of nanorods and lack of real time imaging in nanotechnology cause necessity of process modelling. This article presents a new dynamic model for flexible nanorods on elastic substrate. This model is presented a nine steps strategy to push nanorod and considered the three basic nano forcesvan der Waals, friction and contact force to quantitative analysis of effective parameters. Dynamic analysis of nanorod pushing considering depression on elastic substrate, indention between tip-nanorod and deflection along straight path is presented. Using beam on elastic substrate assumption complete model up to now for nanorod manipulation is obtained. This model is verified by available (theoretical and experimental) results. A polystyrene nanorod is simulated and snap in /pull out distances, critical force and time, maximum deflection and safety factor of process are obtained. Also, it is determined that dynamic mode of micro and nanorods is different. Despite of rolling mode being dominant in micro rod manipulation, sliding mode is observed to be dominant dynamic mode in the pushing of nanorods. Our model can be used in mechanical behaviours of nanorod.
Keywords: Nanomanipulation, Atomic Force Microscope (AFM), Pushing Strategy, Nanorod on Elastic Substrate, JKR Contact Theory.
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TREATMENT OF ZnO NANOWIRES on Si(111)
Seyed Mortaza Zendehbad (PhD.)
Gagik Shmavonyan [PhD.]
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We investigated vapour-phase-epitaxy grown ZnO NWs on a Si substrate by SEM. SEM investigations show that there are single NWs and ensembles of NWs, among which we found straight and bend, perfect (with regular facets and smooth surfaces) and non-perfect (with irregular facets, not smooth surfaces, variable width, damages and particles) NWs, as well as NWs with clean surfaces and surfaces with the dark spots and features. After FIB polishing we found that every NW has a clean homogeneous surface, which allow us to conclude that all those dark spots and surface features of the NWs really are just surface features. The FIB milling gives information of the deeper interior of the NWs, i.e. buried structures within the NWs and whether those structures are propagating within the NWs. But also here we found that there are no buried structures inside the NWs and the dark spots and features are not propagating within the NWs, which leads to the result that the NWs are totally homogeneous. The hexagonal facets of the NWs were observed on SEM images, which emphasizes the good crystalline quality of the NWs. The sizes of the NWs were determined: the length is about 2-24 µm, and the width and height are about 200-500 nm.
Keywords: Scanning Electron Microscope, NANOWIRES on Si(111), FIB milling
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